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Better to get a sharp picture right away

Precise diameter values despite vibrations of the sample

Fast-moving subjects, such as a passing car, must be photographed with a short exposure time if the image is to succeed. Exposure times that are too long result in undesirable blurring. Also, for the measuring technology used to measure diameters during cable production, a short exposure time is decisive for accuracy and ultimately for the quality of the manufactured cable.

In numerous extrusion lines worldwide, the gauge heads of the LASER Series 2000 measure the diameter and ovality of conductors, wires, cables and other products without contact. Incomparable precision, high availability as well as proven industrial design characterize all gauge heads and thus set SIKORA-typical accents.

At the heart of the devices is the innovative method for measuring the diameter using diffraction analysis. Together with a pulse-controlled laser diode, whose extremely short exposure time is 0.25 µs, this combination provides continuously precise measurements. Even in the presence of production-related vibration or rotating oscillation of the sample, it thus contributes significantly to the highest quality of the end product. Every single one of 500 measured values/second is recorded in the entire three-dimensional measuring field with full image sharpness, thus ensuring absolute measuring accuracy.

Particularly in the case of production-related vibrations, the innovative measuring principle and especially the short exposure time pay off.

Measuring methods with short exposure times, such as the LASER Series 2000 from SIKORA, record every single measured value in highest image sharpness for highest accuracy, even with vibrating samples (conductors).

Alternative measuring methods with long exposure times, analogous to photography, result in considerable blurring of the shadow image in the case of vibrating products. Inevitably, this is followed by inaccurate measurement results whose deviations cannot be completely compensated even by the formation of average values.